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- Download Helmut Fischer Driver Ed
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The text above is not a recommendation to remove WIN-HCU by Helmut Fischer GmbH from your PC, nor are we saying that WIN-HCU by Helmut Fischer GmbH is not a good application for your computer. This page simply contains detailed info on how to remove WIN-HCU supposing you want to. Description Handheld instrument with exchangable probe for measuring coating thickness according to the magnetic induction method. For the measurement on ferrous substrates (F), e.g. Paint, lacquer, powder coating, chrome, copper, zinc, as well as enamel or plastic coatings on steel and iron.The FMP30 instrument features additional more memory for numerous customer-specific measuring.
Measuring Made Easy®
FAST and accurate Quality Control for electroless nickel platers
Drivers faro cameras. Knowing the %phosphorus in your electroless nickel plating operation is the key to accurate coating thickness measurement and the determination of other mechanical properties. Please use the button below to download a recording of the webinar.
Still measuring electroless nickel coatings with magnetic induction or hall effect instruments? Now is the time to upgrade your electroless nickel plating operation and begin using measurement instruments that determine the coating properties you need to know. It’s essential for platers to know the percentage of phosphorus content and how it can change the electroless nickel in plating operations. A change in phosphorus content can affect critical properties like mechanical properties, solderability, corrosion resistance and electrical conductivity which ultimately affects the overall quality of the finished coating.
Conveniently, Fischer’s XRF instruments make it easy to measure both the thickness of the coating and determine the percentage of phosphorus in electroless nickel accurately. Knowing these factors allows electroless nickel platers the peace of mind in that their coatings are the exact thickness and composition they need to adhere to customer standards.
- Versatile instrument to measure thick and thin films
- Measure electroplated thicknesses and compososition
- Multiple collimator sizes to meet application needs
- User selectable primary filters to optimize measurements
- Programmable X/Y stages to automate measurements
- Microfocus X-ray tube
Fischer benchtop units exceed the capabilities of handheld gages by offering more and different measurement techniques. With COULOSCOPE® CMS2 and COULOSCOPE® CMS2 STEP, literally any metallic layer, even multi-layers, can be measured on any substrate.
- Destructive Testing
- Not affected by nickel’s magnetic properties
- Calibration Standards Available
- Only way to differentiate different nickel layers
- Not high volume
- Magnetic or Eddy Current Methods
- Probe style gauge, large parts available
- Cost Effective
- Individualized standards required
- Sensitive to electric properties
- Periodic review of the calibration standards
Measuring Made Easy®
FAST and accurate Quality Control for electroless nickel platers
Download Helmut Fischer Driver Ed
Knowing the %phosphorus in your electroless nickel plating operation is the key to accurate coating thickness measurement and the determination of other mechanical properties. Please use the button below to download a recording of the webinar.
Still measuring electroless nickel coatings with magnetic induction or hall effect instruments? Now is the time to upgrade your electroless nickel plating operation and begin using measurement instruments that determine the coating properties you need to know. Drivers ge - security guard. It’s essential for platers to know the percentage of phosphorus content and how it can change the electroless nickel in plating operations. A change in phosphorus content can affect critical properties like mechanical properties, solderability, corrosion resistance and electrical conductivity which ultimately affects the overall quality of the finished coating.
Conveniently, Fischer’s XRF instruments make it easy to measure both the thickness of the coating and determine the percentage of phosphorus in electroless nickel accurately. Knowing these factors allows electroless nickel platers the peace of mind in that their coatings are the exact thickness and composition they need to adhere to customer standards.
- Versatile instrument to measure thick and thin films
- Measure electroplated thicknesses and compososition
- Multiple collimator sizes to meet application needs
- User selectable primary filters to optimize measurements
- Programmable X/Y stages to automate measurements
- Microfocus X-ray tube
Download Helmut Fischer Driver Updater
Fischer benchtop units exceed the capabilities of handheld gages by offering more and different measurement techniques. With COULOSCOPE® CMS2 and COULOSCOPE® CMS2 STEP, literally any metallic layer, even multi-layers, can be measured on any substrate.
Download Helmut Fischer Drivers
- Destructive Testing
- Not affected by nickel’s magnetic properties
- Calibration Standards Available
- Only way to differentiate different nickel layers
- Not high volume
Download Helmut Fischer Driver Download
- Magnetic or Eddy Current Methods
- Probe style gauge, large parts available
- Cost Effective
- Individualized standards required
- Sensitive to electric properties
- Periodic review of the calibration standards